Diffraction-Compensating Coded Aperture for Inspection in Manufacturing.
Tsutomu SakuyamaTakuya FunatomiMasaaki IiyamaMichihiko MinohPublished in: IEEE Trans. Ind. Informatics (2015)
Keyphrases
- quality control
- x ray
- printed circuit boards
- signal processing
- manufacturing systems
- manufacturing processes
- automated visual inspection
- imaging systems
- infrared
- visual inspection
- transmission electron microscopy
- manufacturing industry
- high resolution
- neural network
- manufacturing environment
- electron microscopy
- product quality
- pattern recognition
- production planning
- production process
- manufacturing process
- three dimensional
- expert systems
- case study
- mass customization
- manufacturing companies
- genetic algorithm
- automotive industry
- operations management
- machine vision
- real time