On Removing Redundant Faults in Synchronous Sequential Circuits.
Xijiang LinIrith PomeranzSudhakar M. ReddyPublished in: VTS (1998)
Keyphrases
- built in self test
- fault diagnosis
- fault models
- analog circuits
- model based diagnosis
- artificial intelligence
- fault detection
- digital circuits
- high speed
- fuzzy logic
- circuit design
- fault model
- delay insensitive
- bayesian networks
- sequential data
- root cause
- cmos technology
- social networks
- logic synthesis
- search engine
- real time