Stuck-at Fault Diagnosis of Four-bit Carry Look-ahead Adder by Shannon Expansion via Semi-tensor Product.
Jianmin WangFengqiu LiuYuhu WuPublished in: SICE (2021)
Keyphrases
- fault diagnosis
- tensor product
- b spline
- expert systems
- neural network
- rotating machinery
- bp neural network
- gas turbine
- fuzzy logic
- fault detection and diagnosis
- fault detection
- electronic equipment
- operating conditions
- power transformers
- rbf neural network
- multiple faults
- condition monitoring
- analog circuits
- multi sensor information fusion
- cubic spline
- tennessee eastman
- chemical process
- power plant
- multiscale
- reproducing kernel hilbert space
- monitoring and fault diagnosis
- model selection
- feature set
- feature selection