Functional Constraints in the Selection of Two-Cycle Gate-Exhaustive Faults for Test Generation.
Irith PomeranzPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2021)
Keyphrases
- test generation
- test cases
- mutation testing
- symbolic execution
- test sequences
- constraint programming
- software testing
- test data generation
- fault diagnosis
- machine learning
- information systems
- model based diagnosis
- fault detection
- software systems
- static analysis
- quality assurance
- software engineering
- regression testing
- computer vision
- learning algorithm
- code coverage
- databases