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A Survey of Testing Techniques for Approximate Integrated Circuits.
Marcello Traiola
Arnaud Virazel
Patrick Girard
Mario Barbareschi
Alberto Bosio
Published in:
Proc. IEEE (2020)
Keyphrases
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integrated circuit
electron beam
printed circuit boards
test cases
three dimensional
real time
test data
artificial intelligence
machine learning
similarity measure
signal processing
test set
embedded systems
decision trees
test suite
software testing
test generation