A Survey of Testing Techniques for Approximate Integrated Circuits.

Marcello Traiola Arnaud Virazel Patrick Girard Mario Barbareschi Alberto Bosio

Published in: Proc. IEEE (2020)

Keyphrases

integrated circuit
electron beam
printed circuit boards
test cases
three dimensional
real time
test data
artificial intelligence
machine learning
similarity measure
signal processing
test set
embedded systems
decision trees
test suite
software testing
test generation