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SWiTEST: a switch level test generation system for CMOS combinational circuits.
Kuen-Jong Lee
Charles Njinda
Melvin A. Breuer
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
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test generation
high speed
analog vlsi
delay insensitive
test cases
circuit design
design automation
logic circuits
asynchronous circuits
case study
test sequences
symbolic execution
low power
low cost
cmos technology
real world
software development
floating gate
mutation testing