Automatic Test Pattern Generation for Resistive Bridging Faults.

Piet Engelke Ilia Polian Michel Renovell Bernd Becker

Published in: J. Electron. Test. (2006)

Keyphrases

fault diagnosis
semi automatic
fault detection
computer vision
data structure
test cases
fault detection and diagnosis
neural network
feature selection
multiscale
data driven
labor intensive
digital divide
multiple faults