Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes.

Zaid Al-Ars Ad J. van de Goor

Published in: MTDT (2003)

Keyphrases

test generation
main memory
test cases
symbolic execution
memory subsystem
design automation
test sequences
dynamic random access memory
static analysis
quality assurance
software testing
high density
mutation testing
image processing
index structure
code coverage
relational databases
feature space