SiC power MOSFET gate oxide breakdown reliability - Current status.
Kin P. CheungPublished in: IRPS (2018)
Keyphrases
- current status
- leakage current
- future directions
- low voltage
- silicon dioxide
- electrical properties
- power consumption
- power management
- reliability assessment
- real time
- multiple input
- field effect transistors
- failure rate
- fuel cell
- low cost
- reliability analysis
- power distribution systems
- highly reliable
- computational power
- high speed
- information technology
- expert systems