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Experts
- Rajkumar Buyya
- Thippa Reddy Gadekallu
- Elena Maceviciute
- Sukhpal Singh Gill
- Praveen Kumar Reddy Maddikunta
- Sudeep Tanwar
- Benedita Malheiro
- Pedro Guedes
- Kim-Kwang Raymond Choo
- Manuel F. Silva
- Ben Shneiderman
- Dusit Niyato
- Cristina Ribeiro
- Paulo Ferreira
- Sweta Bhattacharya
- Mamoun Alazab
- Mohsen Guizani
- T. D. Wilson
- Neeraj Kumar
- Paolo Dario
- Soumya Kanti Datta
- Maria Alejandra Rodriguez
- Jiajia Liu
- David W. Bates
- Kinji Mori
- Joel J. P. C. Rodrigues
- Gokul Yenduri
- Quoc-Viet Pham
- Robert Bogue
- Jorge Justo
- Pronaya Bhattacharya
- Jack J. Dongarra
- Ketan Kotecha
- Michael Gurstein
- Tom Coughlin
- Giovanni De Micheli
- Marijn Janssen
- Minxian Xu
- Muhammad Imran
Venues
- CoRR
- IEEE Access
- Sensors
- IGARSS
- HICSS
- IEEE Commun. Mag.
- CHI Extended Abstracts
- Proc. IEEE
- CHI
- AMIA
- Remote. Sens.
- Commun. ACM
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- Computer
- ACM Comput. Surv.
- ECIS
- IEEE Technol. Soc. Mag.
- PACIS
- IEEE Trans. Engineering Management
- Inf. Res.
- Technol. Anal. Strateg. Manag.
- ICIS
- Eur. J. Oper. Res.
- IEEE Consumer Electron. Mag.
- SIGCSE
- Int. J. Technol. Manag.
- Interactions
- Softw. Pract. Exp.
- Comput. Commun.
- Future Gener. Comput. Syst.
- WSC
- Comput. Electron. Agric.
- SMC
- ICRA
- J. Am. Medical Informatics Assoc.
- Scientometrics
- FIE
- IEEE Trans. Instrum. Meas.
- Expert Syst. Appl.
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