Testing for parametric faults in static CMOS circuits.
F. Joel FergusonMartin TaylorTracy LarrabeePublished in: ITC (1990)
Keyphrases
- analog vlsi
- high speed
- delay insensitive
- test cases
- circuit design
- vlsi circuits
- fault model
- cmos technology
- dynamic analysis
- fault diagnosis
- low voltage
- fault models
- low power
- built in self test
- floating gate
- software testing
- model based diagnosis
- focal plane
- power consumption
- low cost
- test generation
- analog circuits
- fault detection
- mixed signal
- random access memory
- reverse engineering
- chip design
- quality assurance
- integrated circuit
- parametric models
- expert systems