Test pattern generation for droop faults.
Debasis MitraSusmita Sur-KolayBhargab B. BhattacharyaSandip KunduAshish NigamSandeep K. DeyPublished in: IET Comput. Digit. Tech. (2010)
Keyphrases
- fault diagnosis
- fault detection
- fault model
- multiple faults
- model based diagnosis
- fault detection and isolation
- neural network
- genetic algorithm
- artificial intelligence
- fault detection and diagnosis
- test cases
- preprocessing
- closed loop
- wireless sensor networks
- database
- computational complexity
- cooperative
- multiscale
- machine learning
- data sets
- real time