Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible Circuits.
Joyati MondalBappaditya MondalDipak Kumar KoleHafizur RahamanDebesh K. DasPublished in: DDECS (2015)
Keyphrases
- markov chain
- fault models
- fault diagnosis
- cmos technology
- missing data
- built in self test
- cellular automata
- missing values
- real valued
- missing information
- neural network
- nano scale
- delay insensitive
- logic circuits
- analog circuits
- boolean functions
- automatic detection
- learning algorithm
- error detection
- root cause
- fault detection
- multiple input
- high speed
- analog vlsi
- multiple faults
- information retrieval
- real time