Structural fault collapsing by superposition of BDDs for test generation in digital circuits.
Raimund UbarDmitri MironovJaan RaikArtur JutmanPublished in: ISQED (2010)
Keyphrases
- digital circuits
- test generation
- decision diagrams
- test cases
- design automation
- symbolic execution
- data flow
- test sequences
- circuit design
- software testing
- static analysis
- fault diagnosis
- finite state machines
- quality assurance
- heuristic search
- model based diagnosis
- functional decomposition
- data sets
- code coverage
- binary decision diagrams
- knowledge compilation
- quality control