Optimal Design of Checksum-Based Checkers for Fault Detection in Linear Analog Circuits.
Heebyung YoonAbhijit ChatterjeeJoseph L. A. HughesPublished in: VLSI Design (1997)
Keyphrases
- optimal design
- fault detection
- analog circuits
- fault diagnosis
- industrial processes
- fault identification
- tennessee eastman
- condition monitoring
- expert systems
- fault detection and diagnosis
- neural network
- failure detection
- water supply
- fuzzy logic
- fault detection and isolation
- chemical process
- robust fault detection
- knowledge acquisition
- fault isolation
- genetic algorithm
- fuel cell
- historical data
- digital circuits
- computational intelligence
- artificial neural networks
- real time