Combinational test generation for various classes of acyclic sequential circuits.

Yong Chang Kim Vishwani D. Agrawal Kewal K. Saluja

Published in: ITC (2001)

Keyphrases

test generation
test cases
test sequences
symbolic execution
logic circuits
design automation
np hard
quality assurance
code coverage
software testing
mutation testing
machine learning
high speed
database
static analysis
database schemes
np complete
case study
databases