Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local Binary Pattern.
Ushik Shrestha KhwakhaliNguyen Thu TraHuynh Vinh TinTruong Duc KhaiChung Quan TinLoh Ing HoePublished in: RIVF (2022)
Keyphrases
- gray level
- local binary pattern
- texture analysis
- texture features
- texture classification
- gray scale
- rotation invariant
- co occurrence
- face recognition
- texture descriptors
- texture information
- texture images
- gabor filters
- binary patterns
- input image
- image segmentation
- gray images
- run length
- illumination invariant
- black and white
- textural features
- gray value
- gray level images
- multiscale
- spatial information
- low contrast
- pixel values
- face detection
- contrast enhancement
- feature extraction
- pattern recognition
- fractal dimension
- background subtraction
- image contrast enhancement
- image analysis