RUN LENGTH
Experts
- Mohammed Javed
- P. Nagabhushan
- Shunsuke Inenaga
- Philippe Castagliola
- Gonzalo Navarro
- Hideo Bannai
- B. B. Chaudhuri
- Masayuki Takeda
- Gad M. Landau
- Kenneth Zeger
- Kun-Mao Chao
- Yuto Nakashima
- Amihood Amir
- Veli Mäkinen
- Michael B. C. Khoo
- Alberto Apostolico
- Kuan-Yu Chen
- Oleg F. Kurmaev
- Yupaporn Areepong
- Daniel Lemire
- Xuelong Hu
- Wei Lin Teoh
- Tomohiro I
- Leena Ikonen
- Kuo-Liang Chung
- Saowanit Sukparungsee
- Ping-Hui Hsu
- Kees A. Schouhamer Immink
- Hendrik C. Ferreira
- Kankar S. Dasgupta
- Krishnendu Chakrabarty
- Usha Sandeep Mehta
- Azriel Rosenfeld
- Yue-Li Wang
- Jia Jie Liu
- Tomasz Kociumaka
- Robert Godin
- Kunsoo Park
- Chin-Chen Chang
Venues
- CoRR
- IEEE Trans. Inf. Theory
- IEEE Trans. Commun.
- ISIT
- Pattern Recognit. Lett.
- CPM
- IEEE Access
- Theor. Comput. Sci.
- Commun. Stat. Simul. Comput.
- SPIRE
- ICDAR
- Pattern Recognit.
- Inf. Process. Lett.
- Entropy
- Sensors
- IACR Cryptol. ePrint Arch.
- WSC
- Qual. Reliab. Eng. Int.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Eur. J. Oper. Res.
- DCC
- CVPR
- Commun. ACM
- Comput. Vis. Graph. Image Process.
- ICIP
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE J. Solid State Circuits
- RFC
- IEEE Trans. Computers
- GLOBECOM
- Comput. Ind. Eng.
- IEEE J. Sel. Areas Commun.
- IEEE Trans. Image Process.
- ICPR
- ICC
- Multim. Tools Appl.
- IWDW
- NeuroImage
- ICASSP
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