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A class of sequential circuits with combinational test generation complexity under single-fault assumption.
Michiko Inoue
Emil Gizdarski
Hideo Fujiwara
Published in:
Asian Test Symposium (2000)
Keyphrases
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test generation
test cases
design automation
test sequences
high speed
fault diagnosis
data generating distribution
computational complexity
asynchronous circuits
mutation testing
independent and identically distributed
case study
feature space
relational databases
quality assurance
symbolic execution