Automatic Optical Inspection for Millimeter Scale Probe Surface Stripping Defects Using Convolutional Neural Network.
Yu-Chieh TingDaw-Tung LinChih-Feng ChenBor-Chen TsaiPublished in: ACIVS (2020)
Keyphrases
- convolutional neural network
- printed circuit boards
- defect detection
- automated visual inspection
- surface defects
- surface inspection
- quality control
- light scattering
- closely spaced
- automatic inspection
- surface reconstruction
- three dimensional
- face detection
- d objects
- semi automatic
- neural network
- laser beam
- fiber optic
- solid state
- white light