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Test Generation for Multiple-Threshold Gate-Delay Fault Model.

Michinobu NakaoYoshikazu KiyoshigeKazumi HatayamaYasuo SatoTakaharu Nagumo
Published in: Asian Test Symposium (2001)
Keyphrases
  • test generation
  • fault model
  • test cases
  • design automation
  • symbolic execution
  • data sets
  • databases
  • software testing
  • fault injection