Takaharu Nagumo

Publication Activity (10 Years)

Years Active: 1994-2002
Publications (10 Years): 0

Publications

Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo
Application of High-Quality Built-In Test to Industrial Designs. ITC (2002)
Michinobu Nakao, Yoshikazu Kiyoshige, Kazumi Hatayama, Yasuo Sato, Takaharu Nagumo
Test Generation for Multiple-Threshold Gate-Delay Fault Model. Asian Test Symposium (2001)
Yasuo Sato, Toyohito Ikeya, Michinobu Nakao, Takaharu Nagumo
A BIST approach for very deep sub-micron (VDSM) defects. ITC (2000)
Takaharu Nagumo, Masahiko Nagai, Takao Nishida, Masayuki Miyoshi, Shunsuke Miyamoto
VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults. DAC (1994)