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Application of High-Quality Built-In Test to Industrial Designs.

Kazumi HatayamaMichinobu NakaoYoshikazu KiyoshigeKoichiro NatsumeYasuo SatoTakaharu Nagumo
Published in: ITC (2002)
Keyphrases
  • high quality
  • industrial applications
  • genetic algorithm
  • image segmentation
  • high resolution
  • hidden markov models
  • decision support