On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults.
Xijiang LinWu-Tung ChengJanusz RajskiPublished in: ATS (2015)
Keyphrases
- test set
- high speed
- error rate
- test cases
- training set
- test data
- training data
- low power
- evaluation methodology
- high quality
- circuit design
- low cost
- detection method
- fault diagnosis
- class distribution
- database
- random selection
- detection algorithm
- steady state
- model based diagnosis
- complex background
- active learning
- image sensor
- data mining
- power supply
- neural network