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Exploiting path delay test generation to develop better TDF tests for small delay defects.
Ankush Srivastava
Adit D. Singh
Virendra Singh
Kewal K. Saluja
Published in:
ITC (2017)
Keyphrases
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test generation
test cases
symbolic execution
design automation
test sequences
multicast tree
quality assurance
machine learning
artificial intelligence
shortest path
machine vision
software testing
test data generation