Exploiting path delay test generation to develop better TDF tests for small delay defects.

Ankush Srivastava Adit D. Singh Virendra Singh Kewal K. Saluja

Published in: ITC (2017)

Keyphrases

test generation
test cases
symbolic execution
design automation
test sequences
multicast tree
quality assurance
machine learning
artificial intelligence
shortest path
machine vision
software testing
test data generation