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Test Generation for Bridging Faults in Reversible Circuits Using Path-Level Expressions.
Mousum Handique
Santosh Biswas
Jatindra Kumar Deka
Published in:
J. Electron. Test. (2019)
Keyphrases
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test generation
test cases
mutation testing
cellular automata
symbolic execution
test sequences
design automation
high speed
static analysis
fault diagnosis
shortest path
markov chain
high level
artificial intelligence
software testing
image data
feature space
fault models
computer vision