CONT: a concurrent test generation system.

Yuzo Takamatsu Kozo Kinoshita

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)

Keyphrases

test generation
test cases
design automation
symbolic execution
test sequences
static analysis
mutation testing
quality assurance
software testing
quality control
test data generation
information systems
data sets
data exchange
image quality
programming language
regression testing
machine learning
databases