A probabilistic model for stuck-on faults in combinational logic gates.
Rafael B. SchivittzDenis Teixeira FrancoCristina MeinhardtPaulo F. ButzenPublished in: LATS (2016)
Keyphrases
- probabilistic model
- fault diagnosis
- graphical models
- generative model
- fault detection
- bayesian networks
- model based diagnosis
- multiple faults
- fault model
- language model
- expectation maximization
- neural network
- logic circuits
- multiscale
- root cause
- information systems
- fault detection and diagnosis
- test cases
- artificial neural networks
- database systems
- spiking neurons
- search engine
- database
- fault detection and isolation