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Hardware Generation of Random Single Input Change Test Sequences.
René David
Patrick Girard
Christian Landrault
Serge Pravossoudovitch
Arnaud Virazel
Published in:
J. Electron. Test. (2002)
Keyphrases
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test sequences
low cost
test cases
hardware and software
video sequences
test generation
image processing
learning algorithm
input data
bit rate
hardware implementation
computing systems
mutation testing
database
data sets
feature selection