Test Generation for Ground Bounce in Internal Logic Circuitry.
Yi-Shing ChangSandeep K. GuptaMelvin A. BreuerPublished in: VTS (1999)
Keyphrases
- test generation
- test cases
- symbolic execution
- design automation
- test sequences
- static analysis
- mutation testing
- software testing
- quality assurance
- reverse engineering
- modal logic
- logic programming
- object oriented
- regression testing
- test data generation
- definite clause
- information technology
- artificial intelligence
- machine learning