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Compaction of ATPG-generated test sequences for sequential circuits.

Rabindra K. RoyThomas M. NiermannJanak H. PatelJacob A. AbrahamResve A. Saleh
Published in: ICCAD (1988)
Keyphrases
  • test sequences
  • test cases
  • video sequences
  • bit rate
  • high speed
  • test generation
  • mutation testing
  • delay insensitive
  • databases
  • database systems
  • feature space
  • database applications
  • generation method
  • logic circuits