Selecting High-Quality Delay Tests for Manufacturing Test and Debug.

Hangkyu Lee Suriyaprakash Natarajan Srinivas Patil Irith Pomeranz

Published in: DFT (2006)

Keyphrases

high quality
statistical tests
test data
test generation
test cases
test suite
multiple choice
null hypothesis
depth map
low quality
higher quality
post hoc
ground truth
manufacturing systems
manufacturing industry
high resolution
control system
learning algorithm