Time and memory-aware runtime monitoring for executing model-based test cases in embedded systems.
Padma IyengharElke PulvermüllerMichael SpiekerJuergen WuebbelmannClemens WesterkampPublished in: INDIN (2013)
Keyphrases
- test cases
- embedded systems
- computing power
- flash memory
- low cost
- test data
- real time
- test generation
- embedded software
- test case generation
- software testing
- regression testing
- test sequences
- test suite
- monitoring system
- test data generation
- cyber physical systems
- software systems
- number of test cases
- test suite reduction
- field programmable gate array
- main memory
- test set
- uml models
- test case selection
- testing process
- error rate
- resource consumption
- computational power
- cooperative
- databases
- data sets