On-Chip Clock Faults' Detector.
Cecilia MetraMichele FavalliStefano Di FrancescantonioBruno RiccòPublished in: J. Electron. Test. (2002)
Keyphrases
- high speed
- built in self test
- fault diagnosis
- low cost
- fault detection
- power consumption
- high density
- analog vlsi
- detection method
- programmable logic
- single chip
- test cases
- real time
- model based diagnosis
- circuit design
- low power
- physical design
- power dissipation
- fuzzy logic
- detection algorithm
- multiple faults
- negative selection algorithm
- duty cycle
- expert systems