Using Launch-on-Capture for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains.
Shianling WuLaung-Terng WangXiaoqing WenZhigang JiangLang TanYu ZhangYu HuWen-Ben JoneMichael S. HsiaoJames Chien-Mo LiJiun-Lang HuangLizhen YuPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)