A linear optimal test generation algorithm for interconnect testing.
Chauchin SuPublished in: ICCAD (1998)
Keyphrases
- generation algorithm
- test data generation
- test cases
- optimal linear
- test case generation
- closed form
- software testing
- semi infinite programming
- optimal design
- test sequences
- test generation
- test suite
- test data
- high speed
- statistical tests
- linear systems
- worst case
- dynamic programming
- minimum error
- model based testing
- image sequences
- optimal control
- data sets
- least squares
- control system
- optimal solution
- number of test cases
- set of test cases