An AC/DC Test Generation System for Gate Array LSIs.

T. Shimono K. Oozeki M. Takahashi Masato Kawai Shigehiro Funatsu

Published in: ITC (1985)

Keyphrases

test generation
gate array
low power
test cases
logic circuits
symbolic execution
test sequences
design automation
quality assurance
static analysis
low cost
software testing
regression testing
high speed
mutation testing
data sets
quality control
error rate
video sequences
code coverage
case study