Shigehiro Funatsu

Publication Activity (10 Years)

Years Active: 1975-1989
Publications (10 Years): 0

Publications

Shigehiro Funatsu, Masato Kawai, Akihiko Yamada
Scan design at NEC. IEEE Des. Test 6 (3) (1989)
Masato Kawai, T. Shimono, Shigehiro Funatsu
Test Data Quality Assurance. ITC (1986)
T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, Shigehiro Funatsu
An AC/DC Test Generation System for Gate Array LSIs. ITC (1985)
Shigehiro Funatsu, Masato Kawai
An Automatic Test-Generation System for Large Digital Circuits. IEEE Des. Test 2 (5) (1985)
Masato Kawai, Hideo Shibano, Shigehiro Funatsu, Shunichi Kato, T. Kurobe, K. Ookawa, Tohru Sasaki
A High Level Test Pattern Generation Algorithm. ITC (1983)
Shigeru Takasaki, Masato Kawai, Shigehiro Funatsu, Akihiko Yamada
A Calculus of Testability Measure at the Functional Level. ITC (1981)
Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu
Automatic System Level Test Generation and Fault Location for Large Digital Systems. DAC (1978)
Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu
Automatic test generation for large digital circuits. DAC (1977)
Shigehiro Funatsu, Nobuo Wakatsuki, Toshihiro Arima
Test generation systems in Japan. DAC (1975)