A High Level Test Pattern Generation Algorithm.

Masato Kawai Hideo Shibano Shigehiro Funatsu Shunichi Kato T. Kurobe K. Ookawa Tohru Sasaki

Published in: ITC (1983)

Keyphrases

generation algorithm
high level
low level
test data generation
test data
lower level
pattern matching
real world
neural network
control system
expert systems
higher level
data analysis
training data
website
computer vision
pattern detection