Automatic test generation for large digital circuits.

Akihiko Yamada Nobuo Wakatsuki Hideo Shibano Osamu Itoh Kyoji Tomita Shigehiro Funatsu

Published in: DAC (1977)

Keyphrases

digital circuits
test generation
test cases
test sequences
symbolic execution
data flow
design automation
finite state machines
model based diagnosis
functional decomposition
static analysis
circuit design
software testing
artificial intelligence
np complete
cooperative
metadata