Random Texture Defect Detection Using 1-D Hidden Markov Models Based on Local Binary Patterns.
Hadi HadizadehShahriar Baradaran ShokouhiPublished in: IEICE Trans. Inf. Syst. (2008)
Keyphrases
- hidden markov models
- defect detection
- local binary pattern
- feature extraction
- texture classification
- visual speech recognition
- texture analysis
- texture features
- texture information
- texture descriptors
- face recognition
- multiscale
- spatial information
- image texture
- rotation invariant
- speech recognition
- scale invariant
- background subtraction
- face detection
- texture images
- facial expression recognition
- feature descriptors
- image processing
- feature space
- textural features
- feature set
- pattern recognition
- baum welch
- computer vision
- object recognition
- reinforcement learning
- sequential data
- three dimensional
- image segmentation