Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG.

Hideyuki Ichihara Tomoo Inoue

Published in: DATE (2003)

Keyphrases

test generation
test cases
symbolic execution
case study
test sequences
real world
image processing
design automation
database systems
high speed
fault diagnosis
fault detection
static analysis
logic circuits
mutation testing