On Redundant Path Delay Faults in Synchronous Sequential Circuits.
Ramesh C. TekumallaPremachandran R. MenonPublished in: IEEE Trans. Computers (2000)
Keyphrases
- power dissipation
- built in self test
- fault diagnosis
- fault models
- path selection
- high speed
- analog vlsi
- logic circuits
- power consumption
- shortest path
- destination node
- fault detection
- fault model
- low power
- analog circuits
- optimal path
- model based diagnosis
- wireless networks
- test cases
- asynchronous communication
- circuit design
- logic synthesis
- highly redundant
- endpoints
- control system