A static fault detection system for digital integrated circuits.
R. NagarajanTan Le LayGoh Mei LinPublished in: Microprocess. Microsystems (1995)
Keyphrases
- fault detection
- integrated circuit
- fault diagnosis
- industrial processes
- fault identification
- condition monitoring
- tennessee eastman
- fuel cell
- robust fault detection
- neural network
- metal oxide semiconductor
- fault detection and diagnosis
- failure detection
- electron beam
- fault detection and isolation
- fault localization
- power plant
- printed circuit boards
- fault isolation
- constraint satisfaction
- fuzzy logic
- expert systems
- artificial intelligence