Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines
Christopher HenardMike PapadakisGilles PerrouinJacques KleinPatrick HeymansYves Le TraonPublished in: CoRR (2012)
Keyphrases
- test suite
- software product line
- test cases
- product line
- goal driven
- test suite reduction
- regression testing
- learning methodologies
- static analysis
- software testing
- similarity measure
- mutation testing
- model checker
- java programs
- teaching learning
- test case generation
- adult literacy
- software engineering
- testing process
- number of test cases
- machine learning
- future directions
- set of test cases
- test data generation
- learning process
- databases
- test sequences
- life cycle