A Complete Characterization of Path Delay Faults through Stuck-at Faults.
Subhashis MajumderBhargab B. BhattacharyaVishwani D. AgrawalMichael L. BushnellPublished in: VLSI Design (1999)
Keyphrases
- fault diagnosis
- fault detection
- fault detection and diagnosis
- multiple faults
- abnormal events
- neural network
- model based diagnosis
- shortest path
- fuzzy logic
- search algorithm
- real world
- multiresolution
- artificial neural networks
- web services
- information systems
- root cause
- data mining
- real time
- fault detection and isolation
- built in self test