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On Test Pattern Generation Method for an Approximate Multiplier Considering Acceptable Faults.
Shogo Tokai
Daichi Akamatsu
Hiroyuki Yotsuyanagi
Masaki Hashizume
Published in:
ITC-Asia (2023)
Keyphrases
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generation method
test cases
feature generation
pattern matching
fault diagnosis
data sets
test generation
image sequences
information retrieval
wavelet transform
multiscale
test data
floating point
test suite
test sequences
real time
built in self test