Implications of Clock Distribution Faults and Issues with Screening Them during Manufacturing Testing.
Cecilia MetraStefano Di FrancescantonioT. M. MakPublished in: IEEE Trans. Computers (2004)
Keyphrases
- test cases
- fault model
- high speed
- fault diagnosis
- manufacturing systems
- probability distribution
- power consumption
- key issues
- data distribution
- quality control
- fault detection
- spatial distribution
- test sequences
- manufacturing environment
- information systems
- manufacturing processes
- root cause
- power law
- image analysis
- decision making