Reduced On-chip Storage of Seeds for Built-in Test Generation.

Published in: ACM Trans. Design Autom. Electr. Syst. (2024)

Keyphrases

test generation
design automation
test cases
symbolic execution
test sequences
high speed
static analysis
quality assurance
software testing
low cost
high density
mutation testing
database
test data generation
solid state
regression testing
circuit design
case study
learning algorithm
real world