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Validation and test generation for oscillatory noise in VLSI interconnects.

Arani SinhaSandeep K. GuptaMelvin A. Breuer
Published in: ICCAD (1999)
Keyphrases
  • test generation
  • test cases
  • test sequences
  • design automation
  • static analysis
  • symbolic execution
  • signal processing
  • input output
  • mutation testing
  • quality assurance
  • test data generation
  • software testing
  • code coverage